Yield is primarily affected by
A. Wafer defects
B. feature size
C. N and P doping
D. etching chemistry
Answer: A. Wafer defects
Yield is primarily affected by
A. Wafer defects
B. feature size
C. N and P doping
D. etching chemistry
Answer: A. Wafer defects
If the answers is incorrect or not given, you can answer the above question in the comment box. If the answers is incorrect or not given, you can answer the above question in the comment box.